DigiM imaging has a broader scope than typical imaging services. We are concerned with the complete life span of samples and images.


For microscopic imaging, sample representativeness is critical, yet often difficult to verify. A larger sample can be as unrepresentative as a high-resolution small sample. Under DigiM’s Focused Ion Beam Scanning Electron Microscope (FIB-SEM) imaging platform, we work closely with our clients to guarantee that a representative sample volume will be imaged at the most appropriate resolution. The sample will be prepared to ensure both optimal image quality and budgetary responsibility. 

Please refer to the image below for an illustration of the set-up of FIB-SEM imaging, and click the links on the right column for more details.

Presentations and Publications

  1. Tracey, J., Lin, S., Jankovic, J., Zhu, A., Zhang, S. (2019). Iterative Machine Learning Method for Pore-Back Artifact Mitigation in High Porosity Membrane FIB-SEM Image Segmentation. Microscopy and Microanalysis. Download here.
  2. Zhang, S., Byrnes, A. P., Jankovic, J., & Neilly, J. (2019). Management, Analysis, and Simulation of Micrographs with Cloud Computing. Microscopy Today, 27(2), 26-33. Read here.
  3. DigiM FIB-SEM Curtaining Removal. DigiM Technology Highlight. February 25, 2015. Request a Copy.
  4. Zhang, S. (2014). Integrated Material Characterization and Property Prediction Using 3D Image-based Analytics and Modeling. Presented at TMS 2014 Annual Meeting in San Diego, CA (February 16-20, 2014).