For microscopic imaging, sample representativeness is critical, yet often difficult to verify. A larger sample can be as unrepresentative as a high-resolution small sample. Under DigiM’s Focused Ion Beam Scanning Electron Microscope (FIB-SEM) imaging platform, we work closely with our clients to guarantee that a representative sample volume will be imaged at the most appropriate resolution. The sample will be prepared to ensure both optimal image quality and budgetary responsibility.
Please refer to the image below for an illustration of the set-up of FIB-SEM imaging, and click the links on the right column for more details.