Regardless of how successful an imaging experiment is, there are always some artifacts. FIB-SEM imaging experiments take a few hours to a few days. A sample with gas or liquid contents reacts to electron and ion beams, which can cause undesirable effects. 

DigiM manages imaging artifacts in three ways:

  1. Artifacts are mitigated during imaging experiments, such as charging, re-deposition, and sample stability.
  2. A suite of software algorithms has been developed to correct artifacts, such as curtaining, stage drifting and intensity variation.
  3. Fundamental understandings of these artifacts are leveraged to design new experiments and study dynamic responses of such samples under electron and ion beam excitations.  

Some example artifacts and DigiM’s corrections are shown below.